Estimation of Stress-Strength Parameter of a Parallel System for Exponential Distribution Based on Masked Data
Abstract
In this study,we estimate the stres-strength parameter (R) for a parallel system with two components based on masked data. In particular, we compute the maximum likelihood and Bayes estimates of R. The considered system consists of two independentcomponents having non-identical complementary exponential lifetimedistributions. Also in the numerical simulation study a comparison between Bayes and maximum likelihood estimates is introduced.
Keywords
Stress-strength reliability; masked samples; parallel system
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